Objects of study

Solid samples.

Applications

By XPS method are determined:

• Chemical composition of the surface – all the elements starting from Li are detected.
• Electron state of the substance components.
• Relative component concentration in the sample.

UPS method - for conductors and semiconductors:

• High resolution analysis of the electron structure of the surface valence band.

Additional possibilities

• Study of the surface state under the reaction conditions at the pressure up to 10^–2 mbar - this is a unique study in the world practice.
• Application of XPS, UPS simultaneously with such methods as in situ thermal desorption, kinetic measurements, low energy electron diffraction (LEED) to study the structure of adsorbed layers.
• Availability of a large set of procedures for sample supporting and spectra calibration.

XPS with angle resolution for study of chemisorbed layers.

Instrument facilities

Electron spectrometers VG ESCALAB HP and VG ESCA-3 (“Vacuum Generators”, Great Britain), ES-300 (“Kratos”, Great Britain). For X-ray generation MgKa and AlKα lines with hγ = 1253.6 eV and 1486.6 eV are used, respectively.

Samples requirements

Solid samples of any morphology in the form of plates, powders, chips and others. The plate size is not less than 6x6 mm², not higher than 12x12x2 mm³. The samples must not be destructible in vacuum.

Leading scientists and their research interests

Prof. V.I. Bukhtiyarov. Study of adsorption and chemical reactions on the surface of model catalysts, study of the formation of heterogeneous catalyst active component.
Prof. A.I. Boronin. Study of the elementary steps of the mechanisms of adsorption and reaction on metal surface (oxygen states on metals, carbon monooxide oxidation, ethylene epoxidation, characterization of carbon materials).
Dr. A.V. Kalinkin. Study of the elementary steps of the mechanisms of adsorption and reaction on metal surface (oxygen states on metals, carbon monooxide oxidation).
Dr. I.P. Prosvirin. Study of adsorption, catalytic reaction mechanisms.
Dr. V.V. Kaichev. Study of heterogeneous reactions mechanism in situ.

Electron spectrometer VG ESCALAB HP

 

 

SIMS-study of SrO-ZrO2 solid solution with various Sr-contant. Surface concludes 1-2 top monolayers, "volume" means a bulk after dispersion of the top layer 10 nm depth.

Objects of study

• Highly dispersed solid samples: catalysts, minerals, soil and others
• Metals and alloys, semiconductors and dielectrics

Applications

• Quantitative analysis of all elements of the periodical system ranging from hydrogen to uranium.
• Analysis of the component depth (to 1 μm)
  distribution with the resolution ~1 nm.
• Analysis of thin films and adsorbed layers.
• Isotope analysis of the surface layers.

Instrument facilities

MS-7201 Mass-spectrometer (Sumy city, Ukrain)

Method sensitivity, % (mass):

• from 10^-5 for alkaline metals to 10^-1 for platinum metals;
• for iron, nickel, cobalt and copper – approximately 10^-3 – 10^-2.

Samples requirements

Leading scientists and their research interests

Prof. V.P. Ivanov. Bulk and supported catalysts.