Phone: +7 (383) 330-67-71, Fax: +7 (383) 330-80-56, E-mail: bic@catalysis.ru
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Morphology
The surface of solids with conductivity, including model metal supported catalysts, mainly – on carbon supports.
1 UHV scanning tunneling microscope (STM) GPI-300 combined with Auger spectrometer. The machine provides:
The best spatial resolution is: lateral – 0.03 nm, vertical – 0.002 nm (for specially prepared samples). The maximal scanning range is 1.2x1.2x1.0 μm3.
2 Ambient conditions scanning multi-microscope SMM2000 providing STM and Contact Mode Atomic Force Microscopy measurements.
The best spatial resolution is: lateral – 0.1 nm, in vertical direction – 0.02 nm (for specially prepared samples). The maximal scanning range is 30x30x2 μm3.
Electron conductivity of the sample surface for STM regime; the height variation across the scan frame – less than 2 μm.
Prof. V.I. Bukhtiyarov and Dr. R.I. Kvon. Model supported catalysts at carbon supports and planar oxide films.