Objects of study

Dispersed powder materials.

Applications

The following parameters are defined:

• Morphology and sizes of the particles.
• Real structure by the methods of diffraction and phase contrasts.
• Atomic structure of the crystals with using of high resolution microscopy and computer simulation of the images.
• The structure of the particles in size to 100 nm by micro diffraction method, in size to 1 nm – by nanobeam diffraction.
• Elemental composition by energodispersion X-ray analysis (EDXA), locality is about 5 nm.
• Phase transformations in situ studies (heating up to 900°C and cooling to –170°C) in real time.
• Nanoparticles texture in 3 dimensions by Electron Tomography with resolution 1–2 nm.

Instrument facilities

Jeol JEM-100CX and JEM-2010 electron microscopes (Japan) are designated for recording of transmission electron images with the magnification up to 1500 000 times. Accelerating voltage is 100 kV for JEM-100CX and 200 kV for JEM-2010. The lattice resolution is 0.2 nm at JEM-100CX, 0.14 nm at JEM-2010.

There are goniometers available for sample inclination up to 45° around the axes x and y and tomographic holder for the samples inclination up to 72° around the axe x. It used detachable device for the sample heating (up to 900°C) and cooling (to –170°C).

Electron microscopes are equipped with video-recording electron system, JEM-2010 is equipped by X-ray microanalyzer EDAX (EDAX Co) with semi-conductor detector, energy resolution is not worse than 130 eV. The elements from B to U are determined.

Samples requirements

Dispersed sample in a quantity of several milligrams.

An example of reconstruction of the shape of metallic particle and carbon filament that formed on the particle in oxidation of hydrocarbons. The method of electron tomography (in High Angle Centered Dark Field regime).

	The model of the surface of metal particle (reconstruction)
	The model of carbon filament with metal particle (reconstruction)

Leading scientists and their research interests

Dr. V.I. Zaikovskii. Catalysts and adsorbents.

Objects of study

Solid samples in the form of powder, plates, pellet and different things with size not more than 200 mm.

Applications

• Study of the surface morphology of the solids with magnification by 5–300 000 times.
• Study of microstructure of the surface of nonconductor materials in low vacuum (1–270 Pa).

Instrument facilities

Jeol JSM-6460 LV scanning electron microscope that is modern digital model of the universal electron microscopy allows to get image of the solids surface with magnification by 5–300 000 times and resolution of 3 nm.

An original microscope design allows to use the full set of devices and options for solid surface study.

Results are presented in the following forms:

• Images of the surface – in a digital form as standard file of the high resolution (1280x960 pic).
• The system of digital treatment (data storage, averaging-out etc) allows to improve images.

Samples requirements

Sizes of solid sample are not more than 200 mm in diameter and 80 mm in height.

The surface of Ni3Al alloy

Netting of FeCrAl alloy

Leading scientists and their research interests

Dr. A.N. Salanov. Solid samples.

Objects of study

The surface of solids with conductivity, including model metal supported catalysts, mainly – on carbon supports.

Applications

• Topography with atomic resolution – for single crystal specimens .
• Particle-size histograms and the localization of the particle at the surface of carbon materials and planar oxide films .

Instrument facilities

1 UHV scanning tunneling microscope (STM) GPI-300 combined with Auger spectrometer. The machine provides:

• the elemental analysis of the surface by Auger spectroscopy;
• residual gases analysis by mass-spectrometer;
• cleaning of the surface by argon etching;
• sample heating up to 1200K.

The best spatial resolution is: lateral – 0.03 nm, vertical – 0.002 nm (for specially prepared samples). The maximal scanning range is 1.2x1.2x1.0 μm³.

2 Ambient conditions scanning multi-microscope SMM2000 providing STM and Contact Mode Atomic Force Microscopy measurements.

The best spatial resolution is: lateral – 0.1 nm, in vertical direction – 0.02 nm (for specially prepared samples). The maximal scanning range is 30x30x2 μm³.

Samples requirements

Electron conductivity of the sample surface for STM regime; the height variation across the scan frame – less than 2 μm.

Leading scientists and their research interests

Prof. V.I. Bukhtiyarov and Dr. R.I. Kvon. Model supported catalysts at carbon supports and planar oxide films.